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SCANNING ELECTRON MICROSCOPE

Tescan logo

Founded as a small company for manufacturing programmable control units for general purposes, upgrading analogue scanning electron microscopes and manufacturing accessories for them in 1991, the TESCAN is today one of the global suppliers of scanning electron microscopes and solutions for materials science, industry, biology and life sciences, forensic science and others.

 

XEIA GAIA FERA

New UHR SEM/i-FIB workstation Whether your applications demand extremely powerful and ultra-fast micro-/nano- FIB machining, an outstanding image resolution at low beam energies,...

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TESCAN GAIA3 brings together an ultra-high resolution electron column and high-performance ion column fitted onto a single chamber. Built on the proven (MAIA3) FE-SEM platform,...

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The world's first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to...

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LYRA QPHASE TIMA-X

The LYRA3 FEG is a favorable combination of SEM and FIB for demanding users. It is based on a high resolution Schottky FEG-SEM column and a high performance FIB column.

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TESCAN proudly introduces the Q-PHASE, a multimodal holographic microscope (MHM). With this instrument TESCAN expands into the field of advanced light microscopy. The Q-PHASE is...

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The TESCAN Integrated Mineral Analyzer (TIMA) is a new SEM-based automated mineralogy solution for the mining and minerals processing industries .....................

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MAIA MIRA VEGA

MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The resolution performance at 1 kV is 1.4...

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This new generation of MIRA field emission scanning electron microscopes provides users with the advantages of the latest technology, such as new improved high-performance...

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The VEGA series was designed with respect to a wide range of SEM applications and needs in today’s research and industry.

 

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Raman Special Software

The fully-integrated correlative Raman imaging and scanning electron microscopy technique. Ultra-structural surface properties can be linked to molecular compound information.

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Using the modern designing and manufacturing systems we are flexible and open to develop and manufacture custom modifications or special custom systems.

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TESCAN produces a number of software solutions. The sophisticated control software is a standard part of every scanning electron microscope produced by TESCAN. There is also a...

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Accessories    

The creation of favorable conditions for the complex analysis of specimens, together with the possibility of high-quality images of the specimen surface for morphological studies...

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Technoorg Logo

The present TL company was founded in 1990 by Research Institute of Technical Physics of the Hungarian Academy of Sciences, Budapest, General Physics Institute of the Russian Academy of Sciences, Moscow, and by famous scientists like Prof. Norbert Kroo, Prof. A. M. Prohorov (Nobel Prize Laureate, 1964), Prof. Árpád Barna and Dezső Szigethy, internationally recognized members of the scientific community. The owner’s list was often subject to change during years. Today Technoorg Linda is mainly privately owned.

Research and development of new methods and instruments is run jointly by our own team and researchers of selected university and academic institution members

For TEM Users

IV7 Universal Ion Mill IV4 Universal Ion Mill Gentle Mill, model IV8

IV7

IV4 IV8

The IV7 model of Technoorg ion mills has been designed for extremely rapid preparation of high-quality TEM/XTEM samples with unsurpassed high thinning rate. The design of the instrument enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.

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Multiple ion sources - High milling rates and final polishing capability in one equipment - Extremely large (>100 µm²) TEM transparent areas - Unique retarding field operation - Optional reactive ion milling, liquid nitrogen cooling and ion beam slope cutting

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Gentle Mill, model IV8 for final polishing and cleaning.

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Gentle Mill, model IV5 Micropol MAG*I*CAL
IV5 Micopol MagicIcal

Gentle Mill, model IV5 for final polishing and cleaning.

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Polisher for TEM & Metallography Model MC 2

• Rugged, corrosion proof construction • Variable speed control for precision polishing • Quick change bayonet mount bowls • Timer for automatic operation • Extremely light load for fragile TEM samples

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Traceable Transmission Electron Microscopy Calibration Sample

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For SEM User

SC-1000 SEM sample preparation system
SC1000

Cross-sectional sample preparation by slope cutting • Final polishing and cleaning of traditional SEM and EBSD samples • High-energy ion gun for rapid milling • Low-energy ion gun for gentle surface polishing and cleaning • Automated parameter settings and operation • Sample rotation and oscillation • Site-specific sample preparation with high-precision positioning • Real-time monitoring of the milling process by high- resolution CCD camera and TFT monitor

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Do you have a sample you'd like to send us to have scanned by our SEM? Contact us enquiry@absotecthailand.com

 

 
 

 

Product Highlight

Q-PHASE

Q-PHASE

TESCAN proudly introduces the Q-PHASE, a multimodal holographic microscope (MHM). With this instrument TESCAN expands into the field of advanced light microscopy. The Q-PHASE is a unique instrument for quantitative phase imaging (QPI) based on patented technology of Coherence-controlled holographic microscopy. This technology uses incoherent light sources (halogen lamp, LED) providing QPI with the highest quality, without any compromises and it is the only QPI technique enabling imaging of samples in scattering media. The Q-PHASE is purposely designed to observe living cells in vitro. It is based on a robust inverted transmission microscope platform. The whole system is situated in a microscope incubator. The full motorization fulfills even the highest demands regarding experiment automation.

 

FERA3

Fera3

The world’s first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to conventional Ga source. This predetermines FERA3 for milling big volumes of materials that were time consuming or impossible so far..


MAIA3

MAIA

MAIA3 from TESCAN is a newly developed analytical scanning electron microscope which demonstrates ultra-high resolution of 1 nm at 15 kV. The resolution performance at 1 kV is 1.6 nm using secondary electrons and 0.8 nm at 30 kV in STEM mode. This powerful instrument is based on TESCAN’s proven three-lens column equipped with a Schottky field emission gun.

 

VEGA3 Easy Probe

EasyProbe

The economical thermoionic SEM that anyone can effort. VEGA3 EasyProbe has resolution 3nm with Wide Field optics and In-Flight Beam Tracing technology. The system comes with the variable pressure mode for non conductive sample. Secondary electron detector for surface topology imaging, Back scatter electron detector with YAG material for elemental imaging, and EDX detector for elemental analysis are all ready in one package. YAG material is next step of BSE detection given higher contrast to diffentiate low Z element comparing to the conventional 4 Quad Solid-State etector. Motorized stage comes as standard. STEM is available as option.

 

IV7 Universal Ion Mill

The IV7 model of Technoorg ion mills has been designed for extremely rapid preparation of high-quality TEM/XTEM samples with unsurpassed high thinning rate. The design of the instrument enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.

 

SC-1000 SEM sample preparation system

SC-1000 SEM Sample Preparation System for high-quality site-specific sample preparation in SEM application

 
     
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