Founded in 2000 with a focus on high-efficiency LED solutions, ABSOTEC began its journey in Malaysia and expanded operations to Thailand in 2007. Our commitment to quality and innovation led us to integrate automation systems into our LED manufacturing process, setting the standard in the industry.
In 2007, we established ourselves as a pioneer in Particle Analysis using advanced SEM/EDS technology in Thailand. Building on this strong foundation, our product portfolio has grown to include state-of-the-art technologies such as SEM, EDS, EBSD, and micro-XRF. We are deeply grateful to our partners and key customers for their continued trust and support. Our technical expertise has earned us recognition in critical industries such as Hard Disk Drive (HDD) manufacturing and forensic science. Today, ABSOTEC is proud to be a market leader in Particle Analysis by SEM/EDS.
On November 1st, 2018, we launched the ABSOTEC SEM and Micro-XRF Service Laboratory, equipped with the latest in automated particle analysis technology. Our cutting-edge SEM systems are designed to support applications including Gunshot Residue (GSR) analysis for forensics, mineral identification, and various other particle-based investigations. Additionally, our M4 TORNADO micro-XRF system enables automated elemental mapping of large, wet, rough, or non-conductive samples—without any sample preparation. This comprehensive capability allows us to deliver complete analytical solutions from macro to micro scale.
3) Electron Backscatter Diffraaction (EBSD): Bruker ED-XS given the combination EDS of EBSD in same imaging.
Ion Milling
Ion cross section and polishing by COXEM IP-10K. With this sample preparation tool, customer can get very clear cross section imaging and grain analyis by EBSD technique.
3D SEM Reconstruction and Colorize Imaging
Power by DigitalSurf
MountainSEM
High Vacuum Coater
High Vacuum Coater: SAFEMATC CCU-010 with Thin film thickness monitoring, <2x10-6 mbar and able to sputter Metal, Carbon, and ITO
Micro XRF Spectrometer - Large Elemental Mapping Analysis
MicroXRF Spectrometer:- Bruker M4 Tornado spot size 20um / Large area elemental analysis, Wet sample, Rough sample, Non-conductive sample without coating
SERVICE CHARGES
Conditions:
SEM imaging (no limit)
EDS quantitative and qualitative (no limit)
EDS linescan, mapping, quatmap, phasemap (no limit)
EDS Automate particle analysis, GSR analysis (no limit)
All SEM picture and EDS result will be sent to customer by email or Wetransfer
All customers will be consulted with our SEM/EDS specialist.
Estimated hour will be informed to customer prior sample acceptance.
All non-conductive sample must be coated prior SEM imaging [Absotec has additional service on this by has additional charging
All consumable part need to bring by customer. Absotec has additonal service and sell as per your needs.
Operating hour is 9:00-18:00, Monday-Friday
ABSOTEC is the sole authorized distributor of TED PELLA in Thailand — the global leader in sample preparation tools and consumables for both SEM and AFM.
From precision instruments to AFM consumables, TED PELLA’s trusted quality is now closer than ever. At ABSOTEC, we proudly maintain the largest stock of TED PELLA products in Thailand to ensure fast, reliable delivery.
Visit our facility and discover how our all-in-one service center can streamline your lab workflow and unlock maximum efficiency — all in one stop.
You can explore the full TED PELLA online catalogue here: www.tedpella.com
New Event
June 8-11, 2026 The 43rd International Conference Of The Microscopy Society Of Thailand
Bruker’s Nion High Energy Resolution Monochromated EELS STEM, HERMES, combines a high brightness cold field emission gun (CFEG) with a state-of-the-art monochromator and Electron Energy Loss Spectroscopy (EELS) to enable atomic resolution imaging, chemical mapping, 4D-STEM, and vibrational spectroscopy in the electron microscope at the highest level.
The EM-40 represents COXEM's latest addition to their expanding family of Tabletop SEMs. The EM-40 comes with ultra-fast 5th-generation signal processing technology and provides high-quality imaging at frame rates of up to 13 fps. Four imaging modes (Fast, Slow, UltraFast, and Photo) allow the user to choose the image quality and speed that best fits their application.
PTPCZ : PowerTome with High Definition Video & Real-Time Display
The PTPCZ features a high-definition video package where the sectioning process is displayed in real-time at the center of the computer monitor. Equipped with a computer control interface, the PTPCZ enables the viewing and recording of the sectioning process in full HD for future viewing and use.
World First! Automated Dehydrating and Critical Point Drying in One System
Fully automated hands off process without necessity of monitoring. Start a process in the evening get your dried specimen in the morning. Greater process reliability and traceability due recipes and process tracking. Dehydration and critical point drying in ONE piece of equipment. Less space required in the laboratory. Samples up to the size of 30mm. Less sample handling. No use of refrigerants.
Delong Instruments has developed the world’s first table-top TEM and specializes in low electron energy
Absotec becomes the distributor of Delong Instruments in Thailand. This is so great opportunity to promote the most advance Low Voltage TEM (LVEM).
Delong Instruments Company is based in Brno, Czech Republic – the world capital of electron microscopy. Delong Instruments has more than 25 years of experience in the field of transmission electron microscopy (TEM). The company is also developing advanced electron-optical instruments, providing engineering design services and manufacturing precision parts and vacuum technology. Its main objective is to make electron microscopes more accessible and practical. That is why Delong Instruments puts extra emphasis on keeping microscopes innovative, compact, and easy to install, maintain and operate. Delong Instruments has developed the world’s first table-top TEM and specializes in low electron energy, which helps their microscopes to achieve high contrast of light elements and low radiation load, thus extending the range of observation methods. For more information, please visit www.delong.cz
LVEM 25E Compact Transmission Electron Microscope
The LVEM 25E is the All in One compact transmission electron microscope. It is versatile in that it combines 3 imaging modes with 2 analytical modes into one self-contained instrument. This advanced design combined with an impressive resolving power makes the LVEM 25E an exceptional partner for all your nanoscale imaging requirements. To request a detailed, no obligations quote today, simply click the button below and we will be happy to provide one for you.
Surface metrology and analysis software for profilometers (2D contact or optical profilometers, 3D areal optical or contact stylus profilometers, confocal microscopes, focus variation microscopes, white-light interferometers and light microscopes).
Visualize and analyze profile and surface data and perform a multitude of studies including surface roughness using an advanced set of professional tools.
MountainsSEM®
MountainsSEM® is a visualization and image analysis software designed specifically for scanning electron microscopes (SEM). MountainsSEM® is compatible with any brand or model of SEM.
Perform 3D reconstruction, semi-automatic image colorization, advanced 2D particle analysis and much more all in an intuitive interface.
MountainsSPIP®
Image processing and analysis software for scanning probe microscopes (SPM) including atomic force microscopes (AFM). Includes tools for particle analysis, colocalization (correlative analysis), force spectroscopy and powerful statistical tools. Includes tools previously contained in SPIP™ image analysis software.
MountainsSpectral®
MountainsSpectral® is a comprehensive solution for image and data processing for use with spectroscopic techniques including Raman, TERS, FT-IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS and XRF.
MountainsImage®
MountainsImage® is a comprehensive image analysis solution for processing B&W and color images obtained using light microscopy and other imaging systems.
The diamond wire saw type DWS.100 is a table saw in horizontal design so that the smallest cut-offs can be observed with the naked eye or also by means of an attached microscope. Minimum roughness and evenness with Rotary drive.
The maximum workpiece cutting area is 90 x 90 mm and the recommended diamond wire thickness is 0.08 to 0.35 mm. The continuously adjustable wire speed goes from 0 to 4 m/s. To ensure a constant cutting pressure, the feed is done by gravity. Workpieces can be cut both wet and dry.
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