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Micro XRF and TXRF Products

Bruker

Micro X-ray fluorescence spectrometry (Micro-XRF) is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small samples or even inclusions. Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

 

M4 TORNADO PLUS

The world's first Micro-XRF spectrometer that enables the detection and analysis of the entire element range from carbon to americium.

As the latest member of the proven, market leading family of M4 TORNADO Micro-XRF analyzers, the M4 TORNADOPLUS also offers additional unique features, such as an innovative aperture management system, an ultra-high throughput pulse processor and a flexible quick-change sample stage.

M4 Tornado Plus

Super Light Element Detection - seeing down to carbon

Using two large-area silicon drift detectors with super light element window and a specifically optimized Rh X-ray tube, the M4 TORNADOPLUS is the first Micro-XRF spectrometer ever to enable the analysis of light elements. Unlike common Micro-XRF systems, which are suitable to detect elements from sodium up, the M4 TORNADOPLUS allows to also measure elements with atomic numbers Z<11, such as fluorine, oxygen, nitrogen and carbon, without compromising the performance and sensitivity in the higher energy ranges. With this performance enhancement, new applications are opening up for Micro-XRF, e.g. in geoscience and mining, biology, polymer research or semiconductor industry.

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Compact Tabletop Micro-XRF Spectrometer

Full Control over Coating Analysis with Micro-XRF

 

The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.

M1 Mistral

The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.

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The M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.

M2 Blizzard

This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.

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High Performance TXRF Spectrometer for Ultra-Trace Element Analysis

Rapid and Cost-Efficient TXRF — A Real Alternative to ICP

Total reflection X-ray fluorescence (TXRF) spectroscopy is a well-established method for trace element analysis of a variety of samples. The S4 T-STAR simplifies TXRF for 24/7 routine operation with guaranteed data quality. Significant improvements of detection limits are accompanied by automatic QC procedures, useful software routines and a unique versatility in terms of sample types and carriers.

  • The benchtop TXRF spectrometer S4 T-STAR offers lowest detection limits in the sub-ppb range.

S4 T-Star

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Brochure

Layer Analysis Brochure (PDF)

M1 MISTRAL Brochure (PDF)

M2 BLIZZARD Flyer (PDF)

M4 TORNADO Brochure (PDF)

M4 TORNADO PLUS Brochure (PDF)

S4 T-STAR Brochure (PDF)

Lab Report XRF 457 - Analysis of Thin Layers (PDF)

 

 

 
 

Product Highlight

 

M4 TORNADO PLUS

M4 TORNADO PLUS: Super Light Element Micro-XRF Spectrometer

AMS Principle

XRF Map

A Broad Range of Applications

Mining & Minerals, Geoscience

The light element capability of the M4 TORNADOPLUS enables new applications in geoscience and mining by allowing differentiation of carbonates, oxides, nitrites and fluorites. More info

Life Sciences / Metallomics

The M4 TORNADOPLUS spectrometer is a powerful tool for determining the elemental composition of any biological matrix in clinical, pharmaceutical and life science applications. More info

Semiconductor & Microelectronics

With its light element capability, the M4 TORNADOPLUS expands the applicability in nitride and oxide based semiconductor research, while the AMS feature keeps electronic components in focus.  More info

Quality Control

The broad application range of the M4 TORNADOPLUS makes it a highly suitable tool for many applications in quality control and assurance, including glass and coating, failure, cement and ceramic analysis. More info

 

 

 

 
     
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