Founded as a small company for manufacturing programmable control units for general purposes, upgrading analogue scanning electron microscopes and manufacturing accessories for them in 1991, the TESCAN is today one of the global suppliers of scanning electron microscopes and solutions for materials science, industry, biology and life sciences, forensic science and others.
TESCAN VEGA
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This combination significantly simplifies the acquisition of both morphological and elemental data from the sample, making MIRA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
Field-free analytical UHR SEM
for materials characterization at nanoscale. Ideal for characterization of materials at low beam energies for maximum surface topography. Excellent imaging of beam-sensitive and non-conductive samples. Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™. Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
UHR SEM for nanomaterials characterization at sub-nanometer scale. High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures). Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale. Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
Versatile UHR cryo-SEM for characterization of your biological and other beam-sensitive specimens. UHR SEM imaging of beam-sensitive samples and non-conductive biological materials at low kV. Excellent imaging capabilities under cryogenic conditions. Routine imaging of nanostructures as well as bulk specimens with the dedicated E-T detect. Extended field-of-view and easy navigation across sample with the Wide Field Optics™ design
TESCAN TIMA delivers high speed, detailed measurements from sample batches unique to mineral processing and the mining industry. Using elemental analysis to provide quantitative data for mineral identification, TIMA does what no other analytical tool in a processing plant does: measure and sort particles for size, composition and texture. TIMA’s operating system features built-in application-specific workflows, along with a database of virtually all mineral species (about 5000 entries) to make the task of interpreting mineral presence significantly easier.
A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization. High throughput, large area FIB processing up to 1 mm. Ga-free microsample preparation. Ultra-high resolution, field-free FEG-SEM imaging and analysis. In-lens SE and BSE detection. Resolution optimization for high-throughput, multi-modal FIB-SEM tomography. Superior field of view for easy navigation. Essence™ easy-to-use, modular graphical user interface
Versatile nanoanalytical FIB-SEM to expand your materials research capabilities. High precision micro sample preparation. Ultra-high resolution field-free SEM imaging and nanoanalysis. Extended field of view and easy navigation. Multi-site process automation. Multi-modal FIB-SEM tomography. Easy-to-use modular software user interface. Attractive optional packages for various applications
Advanced nanofabrication workbench for your research lab. Excellent ultra-high resolution SEM imaging. Best resolution Ga FIB column. High precision nanopatterning engine for electron and ion beams. Multi-gas injection system with a variety of precursor gases. Easy-to-use modular software user interface
A Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis. Curtaining-free large-area cross-sectioning for physical failure analysis of advanced packaging technologies. Prepare large area FIB-cross-sections up to 1 mm wide. Obtain low noise, high-resolution image at low keVs in short acquisition time at FIB-SEM coincidence with the sample tilted. Live SEM-monitoring during FIB milling for precise end-pointing. Observe the most beam-sensitive materials using low keVs ultra-high resolution for surface sensitivity and high material contrast. Effective techniques and recipes for fast and artefact-free cross-sectioning of composite samples (OLED and TFT displays, MEMS devices, isolation dielectrics) at high currents
Complex, yet time-efficient analysis and characterization of structures at the nanoscale is possible only by advanced correlative imaging and automation across various instruments. The AFM-in-SEM approach merges Atomic Force Microscopy and Scanning Electron Microscopy into one tool thatcombines the capabilities of both techniques. Additionally, NenoVision‘scutting-edge correlative imaging of AFM and SEM data sets the product apart from the competition, making NenoVision’s unique Atomic Force Microscope, LiteScope™,the most advanced AFM in SEM on the market.
An ultramicrotome that transforms a normal SEM to a volume SEM. Serial block-face SEM In serial block-face imaging, a microtome resides inside the vacuum chamber of an SEM. A diamond knife repeatedly removes a thin surface layer from the sample block. The removed layer can be as thin as 15 nm. After each sectioning, the exposed block surface is imaged. This automated in situ method can acquire a series of electron micrographs over a large volume.
Safematic GmbH is a dynamic company, a leader in innovative compact high vacuum coating systems.
The company is located in St. Gallen’s Rhine Valley a region full of experts in the field of vacuum and coating technology.
The products of Safematic are manufactured in Switzerland. Safematic provides support and consulting for customers in the field of high vacuum coating technology. Relying on our experienced development team, we are capable of realising customised and functional extensions or new developments efficiently and professionally.
WORLD FIRST CARBON FEEDING CONTINUOUSLY IN CARBON EVAPORATION HEAD WITH FINE CARBON COATER WITHOUT ANY ARCING
Sputtering of indium tin oxide (ITO) and carbon possible
Coat-thickness measurement via double-quartz measuring system (small samples at the centre, large samples at the edge)
Integrated membrane pump (MD 1 Vario-SP)
Integrated turbo pump (Hi Pace 80)
Easy creation of coating recipes, which guarantee reproducible results
Graphical representation of process data with Windows-based Coating LAB software
5.7“ TFT-Touch graphical display
HIGHLIGHTS
Patented unrolling for automatic thread transport in the vacuum.
Automatic target shutter protects your samples during the degassing of the carbon thread.
Electronically controlled process vacuum ensures stable pressure in the receptacle.
Detection and monitoring of implosion guard guarantees safe operation.
Plasma treatment of your sample is possible thanks to an optional plasma unit.
The present TL company was founded in 1990 by Research Institute of Technical Physics of the Hungarian Academy of Sciences, Budapest, General Physics Institute of the Russian Academy of Sciences, Moscow, and by famous scientists like Prof. Norbert Kroo, Prof. A. M. Prohorov (Nobel Prize Laureate, 1964), Prof. Árpád Barna and Dezső Szigethy, internationally recognized members of the scientific community. The owner’s list was often subject to change during years. Today Technoorg Linda is mainly privately owned.
Research and development of new methods and instruments is run jointly by our own team and researchers of selected university and academic institution members
For TEM Users
UniMill
Gentle Mill
MAG*I*CAL
The UniMill model of Technoorg ion mills has been designed for extremely rapid preparation of high-quality TEM/XTEM samples with unsurpassed high thinning rate. The design of the instrument enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.
Easy to use and automated operation
Widest energy range on the market (100 eV- 16 keV)
Gentle Mill is a dedicated model with unique design for end-polishing pre-prepared TEM and/or FIB samples. The patented low-energy ion source and the special sample holder help to reach the ultimate quality for any demand.
Dedicated cutting device for sectioning TEM and smaller SEM specimens. It is a purpose-made tool for cutting almost any solid-state materials with 0.01 mm accuracy.
Micropol is a precise mechanical specimen grinder/polisher designed for planar grinding, dimpling, thinning and polishing. High quality samples are prepared with minimal efforts by the operator.
The new generation of state-of-the-art ion milling system what meets with the highest demands. Multifunctional device for slope cutting and damage-free surface polishing, offered for SEM and EBSD users.
Easy to use and automated operation
Widest energy range on the market
(100 eV- 16 keV)
Whether you wish to sputter, vaporise or plasma treatcarbon – you can configure the device with the right process head for all these applications.
DO NOT WASTE TIME
The device is operational within a short time. The use of high-quality materials and components in combination with innovative ideas produces extraordinarily short process times. The automatic mode allows for reliable and consistent production of thin coatings.
COMPACT AND PRACTICAL
Saving valuable space thanks to small dimensions. Weight has been reduced to a minimum. Standardised small-flange quick connections („ISO-KF“) act as interfaces with your connections.
EASY START-UP AND SERVICING
Unpack, connect, start! Do away with high start-up costs. The plug-and-play concept allows you to start up the device by yourself. You only need to connect the power supply and process gas.
The service technician can run a quick error analysis thanks to the integrated USB service interface. The modular set-up allows for the targeted replacement of defective components.
IV7 Universal Ion Mill
The IV7 model of Technoorg ion mills has been designed for extremely rapid preparation of high-quality TEM/XTEM samples with unsurpassed high thinning rate. The design of the instrument enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.
SemPrep2 SEM sample preparation system
SemPrep2 SEM Sample Preparation System for high-quality site-specific sample preparation in SEM application. Energy range is from 100ev to 16keV. World first of 16keV. Fastest milling rate with the peltier cooling stage make this system is the benchmark in the market.
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