Breakthrough Innovation in IC package decapsulation


The JIACO Instruments MIP decapsulation system allows one to access the area of interest during failure analysis protocol easily and facilitates the determination of the cause of the failure. Its benefits include rapid sample preparation without the introduction of artifacts, which may contribute uncertainty to the fault detection process. This MIP system, in turn, allows the engineer to reach a conclusion as to the actual root cause of the problem, and to define a permanent fix to remove the issue for the future. This MIP plasma system is also invaluable during qualification procedures for new processes and materials.

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