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ULTRA-STABLE SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEMs)

SEM
Electron Microscope
Tescan  

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ULTRA-STABLE SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEMs)

Bruker's line of Nion scanning transmission electron microscopes light up a world of possibilities in materials research. These cutting-edge instruments enable scientists and engineers to explore sample structures at the atomic scale and probe into atomic interactions in four dimensions. Featuring Python-powered open-source software, our STEMs have been designed from the ground up to enable a new generation of experiments. 

Nion ULTRASTEM

With a range of operating voltages between 30 and 200 kV, the Nion ULTRASTEM uses a high-brightness, high-stability cold field emission electron gun (CFEG) that allows higher resolution, higher probe current providing sub-Angstrom resolution imaging, fast nanoanalysis with an atom-sized electron probe, and efficient coupling to a variety of detectors.

  • Operating voltage from 30 to 200 kV
  • Open-source Python-powered control software
  • High-brightness/high-stability cold field emission electron gun (CFEG)
  • High-performance C3/C5 aberration correction
  • Ultra-high vacuum at the sample
  • 4D-STEM capability

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Nion HERMES

Bruker’s Nion  H igh  E nergy  R esolution  M onochromated  E ELS  S TEM, HERMES, combines a high brightness cold field emission gun (CFEG) with a state-of-the-art monochromator and  E lectron  E nergy  L oss  S pectroscopy (EELS) to enable atomic resolution imaging, chemical mapping, 4D-STEM, and vibrational spectroscopy in the electron microscope at the highest level.  

  • Better than 5 meV energy resolution
  • High brightness cold field emission gun (CFEG)
  • Dispersing-undispersing monochromator
  • Open-source Python-powered control software
  • UHV construction
  • Ultra-stable Electron Energy Loss Spectroscopy (EELS) with direct-detection option

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Discover the invisible with Technoorg Linda's Instruments

Technoorg Linda is operating in several fields of nanotechnology. The main activity of the company is developing and manufacturing of ion technology based instruments for extended use in specimen preparation and depth profiling connected to transmission and scanning electron microscopy. These products are fully compatible with all brands of electron microscopes and cover the entire range of the thinning process from the mechanical sample preparation to ion milling and final-polishing.

Company mission

Technoorg Linda is fully committed to serving the global scientific community with the highest-quality sample preparation tools designed for electron microscopy analysis. Our customers include industrial, governmental, and academic research departments and laboratories, covering the full spectrum of materials science instrumentation users. Recognized as a trusted name within the global scientific community, Technoorg Linda is synonymous with precision instruments and world-leading sample preparation techniques.

Our Heritage

Technoorg Linda was founded in 1990 through the collaboration of the Research Institute of Technical Physics of the Hungarian Academy of Sciences in Budapest, the General Physics Institute of the Russian Academy of Sciences in Moscow, and renowned scientists including Prof. Norbert Kroó, Prof. A. M. Prokhorov (Nobel Prize Laureate, 1964), Prof. Árpád Barna, and Dezső Szigethy—esteemed members of the international scientific community. Over the years, the ownership of the company has changed several times. Today, Technoorg Linda is privately owned.

https://www.technoorg.hu/

UNIMILL

The UniMill model of Technoorg ion mills has been designed for extremely rapid preparation of high-quality TEM/XTEM samples with unsurpassed high thinning rate. The design of the instrument enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.

  • Easy to use and automated operation
  • Widest energy range on the market (100 eV- 16 keV)
  • Load-lock system for fast sample exchange
  • LN2 or Peltier cooling option
  • Online monitoring and support

 

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GENTLE MILL

Gentle Mill is a dedicated model with a unique design for end-polishing pre-prepared TEM and/or FIB samples. The patented low-energy ion source and the special sample holder help to reach the ultimate quality for any demand.

  • Automated operation
  • Final step for the perfect result
  • protective transfer capsule
  • Special adaptor for Hitachi microscopes
  • Online monitoring and support

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Product Highlight

ULTRA-STABLE SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEMs)

Nion HERMES

Bruker’s Nion  H igh  E nergy  R esolution  M onochromated  E ELS  S TEM, HERMES, combines a high brightness cold field emission gun (CFEG) with a state-of-the-art monochromator and  E lectron  E nergy  L oss  S pectroscopy (EELS) to enable atomic resolution imaging, chemical mapping, 4D-STEM, and vibrational spectroscopy in the electron microscope at the highest level.  

S(q, w) diagram of phonon dispersion curves in hexagonal Boron Nitride at two different temperatures (parallel acquisition)

 

 

 

 
     

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